PEIR 2000HR series|SWIR Objective lens for near 1000-2000nm.Application for failure analysis of semiconductor devices to detect extremely weak emission from leakage current.PEIR 20X 2000HR / PEIR 50X 2000HR
Model | PE IR Plan 10X 2000HRS | PEIR Plan 20X 2000HR | PEIR Plan 50X 2000HR |
Magnification | 10X | 20X | 50X |
Working distance | 20mm | 10mm | 10mm |
Focal distance(f) | 20mm | 10mm | 4mm |
N.A | 0.33 | 0.6 | 0.7 |
Resolving power | 2.9um | 1.6um | 1.4um |
Focal depth(±D.F) | 7.1um | 2.1um | 1.5um |
Transmission over 70% | 1000 – 2100nm | 1000 – 2000nm | 1000 – 2000nm |
Weight | 490g | 610g | 560g |
NOTE: Resolving power and focal depth are calculated by using the parameter of wavelength (λ=1.55um).
R = 0.61 x 1.55/ N.A Focal depth ±D(um) = λ/[2(N.A)²]